Electron Microscopy Core

The Electron Microscopy Core at Houston Methodist is a service and research resource equipped to perform scanning electron microscopy, transmission electron microscopy, fluorescent microscopy, and atomic force microscopy.

 

The core houses brand new FEI Nova NanoSEM, Scanning Electron Microscope (FEI Nova NanoSEM), sample processing equipment (sputter-coater) and two Bruker atomic force microscopes – the Catalyst and the MultiMode®.

 

The core staff is available to train and assist with sample preparation and imaging samples. The core is a fee-for-use and fee-for-service facility.

 

Core Director:

Jianhua (James) Gu
713.441.9955
jgu@houstonmethodist.org

Equipment

At the Electron Microscopy Core, we are equipped with the ability to perform scanning electron microscopy, transmission electron microscopy, fluorescent microscopy, and atomic force microscopy. We offer three types of electron microscopes: a scanning electron microscope, a catalyst atomic force microscope and a multimode atomic force microscope. We also offer other equipment related to the use of these microscopes.

  • Nova NanoSEM 230
  • Biocatalyst Atomic Force Microscope
  • Multimode Atomic Force Microscope
  • SEM Sample Preparation
  • Transmission Electron Microscopy (TEM) Processing Equipment
  • Nova NanoSEM 230

    Nova NanoSEM 230

    The FEI Nova NanoSEM 230 is an ultra-high resolution scanning electron microscope that provides nanoscale images of material and biological specimens. Ultra-high resolution imaging can be performed at high and low vacuum, permitting imaging in the presence of non-conducting and contaminating materials. The system features secondary and backscattered electron in-lens detection and beam deceleration.

  • Biocatalyst Atomic Force Microscope

    Biocatalyst Atomic Force Microscope

    The Bruker Catalyst atomic force microscope is a high-resolution optical imaging, life science atomic force microscope. The system integrates atomic force microscopy with fluorescent microscopy using MIRO software. This allows optical images to guide atomic force microscopy imaging and force measurements. This system is compatible with coverslips, Petri dishes and a perfusing stage incubator. PeakForce Quantitative Nanomechanical imaging mode and Peak Force Tapping provide mechanical properties of living cells.

  • Multimode Atomic Force Microscope

    Multimode Atomic Force Microscope

    The Bruker MultiMode atomic force microscope is an ultra-high resolution material science microscope, equipped with ScanAsyst and PeakForce Quantitative Nanomechanical imaging modes and Peak Force Tapping technology. Imaging can either be performed in air or fluid medium, enabling imaging of electrical and nanomechanical properties.

  • SEM Sample Preparation

    SEM Sample Preparation

    A sputter coater lets you cover a specimen with a thin layer of conducting material. The Cressington 208HR now offers real solutions to the problems encountered when coating difficult samples for FE-SEM. In order to minimize the effects of grain size, the 208HR offers a full range of coating materials and gives unprecedented control over thickness and deposition conditions. We also use a Critical Point Dryer to keep cell walls from breaking apart when being dried in sample preparation.

  • Transmission Electron Microscopy (TEM) Processing Equipment

    Transmission Electron Microscopy (TEM) Processing Equipment

    The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections, as well as perfect smooth surfaces of biological and industrial samples for TEM, SEM, atomic force and light microscopy examination.

     

    The PELCO BioWave Pro, a microwave tissue processing system, enables rapid specimen turnaround while at the same time delivering consistent results for optimum imaging quality.

Training

To insure that new users have adequate expertise to use the scanning electron microscope, training is required. Training includes one session to introduce and demonstrate the scanning electron microscope and a second session for hands-on work with a standard sample. The length of each session is depends on user experience. Please see the fee schedule for information on training pricing.

Fees

Our fee schedule outlines the costs of training, sample preparation and use of the electron microscopes.

 

Scanning Electron Microscope

 

  • Unassisted internal use, $35 per hour (charged in 15-minute increments)
  • Unassisted external use, $50 per hour (charged in 15-minute increments)
  • Services, samples submitted for imaging by core, $75 per hour
  • Questions and help for trained users, free (it is our pleasure)

 

SEM Sample Prep

 

  • Sputter coating, $2.50 per 1 nm layer use

 

Atomic Force Microscope

 

  • Catalyst Microscope, $50 per hour (charged in 15-minute increments)
  • Multimode Microscope, $20 per hour (charged in 15-minute increments)
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